15

Fluoridation and the "Threat" of Science

Year:
1963
Language:
english
File:
PDF, 981 KB
english, 1963
19

Ritzuntersuchungen an Siliziumeinkristallen

Year:
1975
Language:
german
File:
PDF, 514 KB
german, 1975
23

Defect engineering as an important factor in developing VLSI substrates

Year:
1983
Language:
english
File:
PDF, 511 KB
english, 1983
26

Investigation of defect structures in multi-crystalline silicon by laser scattering tomography

Year:
2005
Language:
english
File:
PDF, 548 KB
english, 2005
28

Some observations concerning the initial stage of plastic flow in silicon

Year:
1978
Language:
english
File:
PDF, 150 KB
english, 1978
31

Differences in plastic deformation behaviour of CZ- and FZ-grown silicon crystals

Year:
1981
Language:
english
File:
PDF, 139 KB
english, 1981
32

Thermomechanical Behaviour of Stress-Reduced Silicon Wafers

Year:
1982
Language:
english
File:
PDF, 232 KB
english, 1982
33

Influence of backside argon implantation on the Si-SiO2 interface

Year:
1983
Language:
english
File:
PDF, 1.48 MB
english, 1983
34

Deep Levels in Czochralski p-Si Due to Heat Treatment at 600 to 900 °C

Year:
1984
Language:
english
File:
PDF, 239 KB
english, 1984
40

On Quenching Induced Deep Levels in Czochralski p-Silicon

Year:
1989
Language:
english
File:
PDF, 237 KB
english, 1989
45

Patient adherence to antihypertensive medical regimens

Year:
1977
Language:
english
File:
PDF, 576 KB
english, 1977
48

Psychosocial Predictors of Change in Cigarette Smoking

Year:
1989
Language:
english
File:
PDF, 510 KB
english, 1989